The excitation energy of Th-229m is 8.4 eV, the lowest among all nuclides. The decay pathways of Th-229m are thought to compete among Internal Conversion (IC), γ ray transition, and Electron Bridge (EB) transition. Considering the excitation energy of 8.3 eV, IC may be prohibited depending on the chemical state. For example, the ionization energy of neutral Th is 6.3 eV, which is lower than the excitation energy. Therefore, the bonds the excitation energy is larger than the ionization energy, leading to deexcitation via IC. On the other hand, the ionization energy of Th+ is 12.1 eV, which is higher than the excitation energy. In this case, IC is prohibited, resulting in deexcitation via γ ray transition or EB transition. Both IC electrons and γ rays have been observed in the decay of Th-229m. However, the reported half-lives of the γ-ray emissions vary. The γ-ray emission half-life has been measured for four types of the samples. The one is Th-229m in the ion trap, for which a half-life of 1400 s was reported. The second to fourth is Th-229m implanted in MgF2, CaF2 or LiSrAlF6, for which half-life of 2210 s, 1740 s and 1287 s were reported. One of the reasons for this difference in half-life is thought to be the chemical environment of Th-229m. In the crystal (CaF2, MgF2), Th interacts with the constituent atoms of the crystal, whereas in the ion trap method, the half-life of isolated Th is measured. This interaction may affect the half-life of Th-229m. This study aims to stably hold Th2+, 3+-229m using the rare gas matrix isolation method and observe γ rays. Even if γ rays are observed using this method, the half-life may not be equivalent with those reported in the previous studies due to interactions between Th and the rare gas. Therefore, in this presentation, we analyze the chemical state of Th in rare gas solids and changes in the electronic state of Th due to interactions with rare gases through theoretical calculations. As a result, it was found that Th-229m maintains an ionic state in the rare gas solid, which is thought to deexcite via γ ray transition. However, due to interactions with the rare gas, slight influx of electrons from the rare gas to Th was observed, leading to the increase of the number of valence electrons compared to isolated Th. Furthermore, due to the presence of a small number of electrons in the LUMO, there is a possibility that the outer-shell electron could be emitted as an IC electron. In the presentation, we will provide comprehensive discussion on the change of half-life of various Th-229m samples using the calculation results for isolated Th-229m ions and Th-229m in CaF2 and MgF2.